My research interests are statistical process control, structural equation modeling
(SEM), and path analysis. Statistical process control is a statistical tool for monitoring
the manufacturing process to stay in control and minimize the loss during the process.
I have devoted myself to statistical process control for most of my academic career.
But for the last ten years, I also have been interested in SEM, including path analysis.
SEM and path analysis mainly develop relations among multiple variables using
covariance structures. Recently, I have been focusing my research on the within-subject
repeated measures design, which is especially necessary when the measures are repeated
within each subject. However, this has not been studied much in the literature despite
the prevalence of such circumstances.
